Abstract: Predicting the single-event upset (SEU) rates of semiconductor devices is essential for their deployment in space and terrestrial cosmic-ray environments. Although various SEU-rate equations ...
Taeyoun Kim, Aviral Kumar Surrogate Fidelity: When Can Open LLMs Explain Closed Ones? Philippe Chlenski, Zachariah Carmichael, Ayush Warikoo, Chia-Tse Shao, Yingxiao Ye, Aobo Yang, Vivek Miglani, ...
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